Method | Resolution / detection limit | Physical basis | Environment | EVs morphology | Detailed internal structure | Fine membrane structure |
---|---|---|---|---|---|---|
SEM | 1Â nm | Emission of electrons | Vacuum | Spherical but agglomeration can be occurred due to the drying process | No | No |
AFM | 1nma (XY), 0.1 nma (Z) | Physical interaction with sample | Vacuum, air, and liquid | Globular | No | No |
TEM | 0.1Â nm | Scattering of electrons | Vacuum | Rounded or cup-shaped | No | Low quality |
Cryo-EM | < 15Å | Scattering of electrons in low temperature | Vacuum | Rounded and 3D structure can be composed | Yes | High quality |